Automatic Detection of Metal Implant Location in Hexagonally Sampled MAVRIC-SL
Bragi Sveinsson 1 , Valentina Taviani 1 , Garry Gold 1 , and Brian Hargreaves 1
Radiology, Stanford University, Stanford,
CA, United States
Multi-spectral Imaging (MSI) allows imaging close to
metal implants at the cost of increased scan time.
Previous work has demonstrated how MSI scan time can be
shortened by hexagonally undersampling ky/kz-space and
removing the resulting aliased replicas using a zeroing
mask. This required the extra step of the operator
providing the approximate location of the implant to the
reconstruction software. In this work, we demonstrate
how the detection of the implant location can be fully
automated by hexagonally sampling adjacent slices in a
complementary manner and combining the bins to get an
estimate of the slice profile with minimal aliasing.
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