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Abstract #0015

MRI based RF safety characterization of implants using the implant response matrix: a simulation study.

Janot P. Tokaya1, Alexander J.E. Raaijmakers2,3, Peter R. Luijten2, and Cornelis A.T. van den Berg1

1Radiotherapy, UMC Utrecht, Utrecht, Netherlands, 2Radiology, UMC Utrecht, Utrecht, Netherlands, 3Biomedical Image Analysis, Eindhoven University of Technology, Netherlands

We introduce a general description of the RF response of an implant, defined as the implant response matrix (IRM). An analytical expression for the IRM is derived through basis functions that depend on a limited number of parameters. This analytical model is validated with a simulation study (Pearson correlation coefficients with simulations R: 0.9979-0.9996). This description allows a significant reduction in unknowns enabling IRM assessment by MRI measurements without hardware modifications to scanner or implant. The feasibility of MRI based IRM/TF measurement is shown in silico. With the simulated complex B1+ fields the IRM is accurately reconstructed (R: 0.974).

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