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Abstract #3068

Simple Method for MR Gradient System Characterization

Nii Okai Addy1, Hochong H. Wu1, Dwight G. Nishimura1

1Electrical Engineering, Stanford University, Stanford, CA, USA

For fast imaging sequences such as EPI, spirals and 3D cones, the actual k-space trajectories achieved on the scanner may deviate from the ideal case resulting in image artifacts in reconstruction. The typical solution to this problem is to measure the trajectories. This however, can potentially be a time consuming process. This work provides a simple, time efficient method to both characterize the MR scanners gradient system and provide a means for estimating the actual trajectories achieved on the scanner.