Meeting Banner
Abstract #4362

Uncertainty in VFA T1 Mapping with Multiple Flip Angles

Matthias Christian Schabel1, Glen R. Morrell1

1Radiology, University of Utah, Salt Lake City, UT, USA

A rigorous lower bound to T1 uncertainty in dual flip angle VFA measurements is derived from a propagation of errors analysis of the signal equation. Monte Carlo simulations suggest that this lower bound also applies to VFA measurements made with 3 or more flip angles.