The Effects of Induced B0 and B1 Magnetic Field Perturbations on Efforts to Image Near Embedded Metal Hardware

Kevin M. Koch¹, Kevin F. King¹, Graeme C. McKinnon¹

Recent developments have demonstrated an improved capability of MR imaging near metal implants. These new methods are capable of removing bulk image distortions near commonly utilized metal implants. Here, we explore the more nuanced image intensity effects due to B₁ perturbations and severe B₀ gradients on these recently demonstrated imaging approaches. Computational field estimates are utilized to simulate MR images near simple metal implant geometries. These simulations generally agree with empirically measured images, and therefore help explain the remaining limitations to imaging near metal implants.