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Abstract #0775

Safely Detecting Device Coupling Using Reversed RF Polarization and Pre-Spoiled EPI

William Overall1, Pascal Stang1, John Pauly1, Greig Scott1

1Electrical Engineering, Stanford University, Stanford, CA, United States

The degree of coupling present in long-wire implants can be quantified by reversing the RF receiver polarization. To assess device coupling in patients with potentially dangerous implants, a four-shot projection EPI sequence may be used safely given reasonable assumptions. Image quality and reliability can be improved by adding a small pre-spoiler gradient to suppress imperfections due to electrodynamic effects.