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Abstract #2841

Ink-Net: Safe 256 Channel EEG at 7T

Daniel G. Wakeman1, Boris Keil1, Bill McSwain2, Maria Ida Iacono1, Catherine Poulsen2, Giorgio Bonmassar1

1A.A. Martinos Center for Biomedical Imaging, Harvard Medical School, Radiology, Massachusetts General Hospital, Charlestown, MA, United States; 2Electrical Geodesics, Inc., Eugene, OR, United States

We show safety testing of a new 256 channel EEG device at 7T. Previous studies have shown that high density EEG caps in high field strength MRI (3 & 7T can generate high SAR. We performed SAR simulations and Temperature measurements on a conductive phantom to test the risk of heating.