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Abstract #0178

A Simulation Based Validation of a pTx Pulse Design Strategy Using Implant-Friendly Modes for Patients with DBS Implants

Yigitcan Eryaman 1,2 , Bastien Guerin 2 , Can Akgun 3 , Joaquin L. Herraiz 1 , Adrian Martin 1,4 , Angel Torrado-Carvajal 1,5 , Norberto Malpica 1,5 , Juan A. Hernandez-Tamames 1,5 , Emanuele Schiavi 1,4 , Elfar Adalsteinsson 6,7 , and Lawrence L. Wald 2,7

1 Madrid-MIT M+Vision Consortium in RLE, MIT, Cambridge, Massachusetts, United States, 2 Martinos Center for Biomedical Imaging, Dept. of Radiology, MGH, Charlestown, MA, United States, 3 Invenshure, MN, United States, 4 Dept. of Applied Mathematics, Rey Juan Carlos University, Madrid, Spain, 5 Dept. of Electronic Technology, Rey Juan Carlos University, Madrid, Spain, 6 Dept. of Electrical Engineering and Computer Science, MIT, Cambridge, Massachusetts, United States, 7 Harvard-MIT Health Sciences and Technology, MIT, Cambridge, MA, United States

We present a pulse design strategy that can be used to safely scan patients with implants. Our strategy is based on utilizing implant friendly modes which are defined as the modes of an array that cancel the local SAR around the implant lead tip. We performed EM simulations using a multi-tissue realistic head model with a generic deep brain stimulator implant. As a result of the pulse design, local SAR at the lead tip is reduced below SAR limits. A uniform axial flip angle distribution is obtained.

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