Abstract #0178
A Simulation Based Validation of a pTx Pulse Design Strategy Using Implant-Friendly Modes for Patients with DBS Implants
Yigitcan Eryaman 1,2 , Bastien Guerin 2 , Can Akgun 3 , Joaquin L. Herraiz 1 , Adrian Martin 1,4 , Angel Torrado-Carvajal 1,5 , Norberto Malpica 1,5 , Juan A. Hernandez-Tamames 1,5 , Emanuele Schiavi 1,4 , Elfar Adalsteinsson 6,7 , and Lawrence L. Wald 2,7
1
Madrid-MIT M+Vision Consortium in RLE, MIT,
Cambridge, Massachusetts, United States,
2
Martinos
Center for Biomedical Imaging, Dept. of Radiology, MGH,
Charlestown, MA, United States,
3
Invenshure,
MN, United States,
4
Dept.
of Applied Mathematics, Rey Juan Carlos University,
Madrid, Spain,
5
Dept.
of Electronic Technology, Rey Juan Carlos University,
Madrid, Spain,
6
Dept.
of Electrical Engineering and Computer Science, MIT,
Cambridge, Massachusetts, United States,
7
Harvard-MIT
Health Sciences and Technology, MIT, Cambridge, MA,
United States
We present a pulse design strategy that can be used to
safely scan patients with implants. Our strategy is
based on utilizing implant friendly modes which are
defined as the modes of an array that cancel the local
SAR around the implant lead tip. We performed EM
simulations using a multi-tissue realistic head model
with a generic deep brain stimulator implant. As a
result of the pulse design, local SAR at the lead tip is
reduced below SAR limits. A uniform axial flip angle
distribution is obtained.
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