Sparse Parametric Imaging for direct parameter measurement: theory and phantom experiments

We present a novel method for directly measuring morphological parameters from highly undersampled data without need for image reconstruction. We introduce the theory underpinning the approach and demonstrate it using synthetic and physical phantoms. The physical phantom measurements showed excellent agreement with ground truth (R ² >0.999). The mean measurement bias was less than one voxel. We conclude that SPI is a method with the potential to allow quantitative measurements of interest to be made from highly undersampled k-space data without need for explicit image reconstruction.

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