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Abstract #4866

Worst-Case Analysis of RF-Induced Heating During MRI Scanning in a Generic Multi-Component Orthopedic Medical Implant Applying the Design of Experiment Method (DoE)

Mahdi Abbasi 1,2 , Gregor Schaefers 1 , Juan D. Snchez 1 , and Daniel Erni 2

1 MR:comp GmbH, Gelsenkirchen, NRW, Germany, 2 General and Theoretical Electrical Engineering (ATE), University of Duisburg-Essen, Duisburg, NRW, Germany

MRI is known as a non-invasive imaging technique of the inner parts of the body. Temperature rise in surrounding tissue of a metallic implant needs to be calculated carefully for the patients safety. Calculating spatial induced electric field and SAR become more complex when the implant is non-uniform in shape and contains several parts. The effect of each component of a multi-component generic hip implant on RF heating has been studied by applying the Design of Experience (DoE) method. By using Taguchi method, the effect of each variable could be estimated as well as any arbitrary configuration of the implant including worst and safest configurations.

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