Fast B1 inhomogeneity correction in bSSFP imaging using transient-state signal
Min-Oh Kim 1 and Dong-Hyun Kim 1
Electrical and electronic engineering,
Yonsei University, Seoul, Seoul, Korea
B1+ inhomogeneity induces different signal modulations
spatially, therefore, it needs to be corrected to make
the acquired images more reliable. Here, an extremely
fast B1 mapping method is proposed to correct B1
inhomogeneity induced image modulation in bSSFP imaging
using early transient-state signal.
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