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Abstract #1820

Prediction of RF Preamplifier Noise Temperature Variations in a Magnetic Field

Cameron M. Hough 1 , Russell L. Lagore 2 , Cecilia Possanzini 3 , and Nicola De Zanche 1

1 Department of Oncology, University of Alberta, Edmonton, Alberta, Canada, 2 Center for Magnetic Resonance Research, University of Minnesota, Minneapolis, Minnesota, United States, 3 Philips Healthcare, Best, Netherlands

In this work we investigate the noise temperature variations of RF preamplifiers when exposed to an external magnetic field. The noise parameters are expressed in terms of the transconductance which varies with the magnetic field and is readily derived from S parameters measured using a network analyzer. Models for field-effect transistors and bipolar-junction transistors were applied and fitted to measured noise temperature data. Noise parameter changes as a function of B 0 are calculated.

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