Slice profile corrections in the XFL (magnetization-prepared turbo-FLASH) B1-mapping sequence
Alexis Amadon 1 , Franck Mauconduit 2 , Alexandre Vignaud 1 , and Nicolas Boulant 1
I2BM / NeuroSpin / UNIRS, CEA, Gif-sur-Yvette,
Healthcare, Saint-Denis, France, France
The XFL sequence is a very fast 2D multi-slice
B1-mapping sequence relying on the measurement of the
magnetization Flip Angle (FA) of a selective preparation
saturation pulse immediately preceding a centric-ordered
FLASH readout. Like most 2D B1-mapping sequences,
imperfect slice profiles introduce biases in the B1
measurement. Here we correct for this bias by taking
into account the preparation & imaging slice profiles as
well as the B0 offset map.
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