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Abstract #3734

Regularized Inversion of Metallic Implant Susceptibility from B0 Field Maps

Xinwei Shi 1 , Daehyun Yoon 2 , Kevin Koch 3 , and Brian Hargreaves 2

1 Electrical Engineering, Stanford University, Stanford, CA, United States, 2 Radiology, Stanford University, CA, United States, 3 Radiology, Medical College of Wisconsin, WI, United States

3D Multi-Spectral Imaging techniques have made significant advancements toward imaging near metal, with their ability to correct for most of the distortion and signal loss. However, in close vicinity of implants, artificial signal voids and dark tissues are indistinguishable with lack of signal in the location of the actual implant, and this makes it challenging to visualize the implant geometry or to examine the tissue/implant interface. In this work, we demonstrate a regularized inversion approach to estimate the susceptibility map from the B0 field maps and thereby differentiate the metallic voxels from artificial signal void or dark tissues.

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