Abstract #3734
Regularized Inversion of Metallic Implant Susceptibility from B0 Field Maps
Xinwei Shi 1 , Daehyun Yoon 2 , Kevin Koch 3 , and Brian Hargreaves 2
1
Electrical Engineering, Stanford University,
Stanford, CA, United States,
2
Radiology,
Stanford University, CA, United States,
3
Radiology,
Medical College of Wisconsin, WI, United States
3D Multi-Spectral Imaging techniques have made
significant advancements toward imaging near metal, with
their ability to correct for most of the distortion and
signal loss. However, in close vicinity of implants,
artificial signal voids and dark tissues are
indistinguishable with lack of signal in the location of
the actual implant, and this makes it challenging to
visualize the implant geometry or to examine the
tissue/implant interface. In this work, we demonstrate a
regularized inversion approach to estimate the
susceptibility map from the B0 field maps and thereby
differentiate the metallic voxels from artificial signal
void or dark tissues.
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