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Abstract #3302

Slice Profile Correction in 2D Magnetic Resonance Fingerprinting (MRF)

Dan Ma1, Shivani Pahwa1, Vikas Gulani1, and Mark Griswold1

1Radiology, Case Western Reserve University, Cleveland, OH, United States

The goal of this study is to characterize and improve the accuracy and repeatability of 2D MRF scans in the presence of slice profile imperfections. Slice profile imperfection causes deviation between the actual flip angles and nominal flip angles, which affects the accuracy of measured T1 and T2 values. This error can be corrected by simulating the RF excitation pulse in the dictionary. No extra scan time or post-processing time is needed once the new dictionary is simulated. The accuracy of both T1 and T2 is improved after slice profile correction. MRF also demonstrates good repeatability, with the coefficient of variance (CV) of 1.17% for T1 and 3.08% for T2.

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