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Abstract #0002

Optical-based probe for real time assessment of RF electrical field during MRI exam

Isabelle Saniour1, Gwenaël Gaborit2,3, Lionel Duvillaret3, Anne-Laure Perrier2, and Olivier Beuf1

1Univ. Lyon, CREATIS ; CNRS UMR 5220 ; INSERM U1206 ; INSA-Lyon ; UJM-Saint-Etienne ; Université Lyon1, Villeurbanne, France, 2Univ. Savoie-Mont-Blanc, IMEP-LAHC, Le Bourget-du-Lac, France, 3Kapteos, Sainte-Hélène-du-Lac, France

During MRI exam, Specific Absorption Rate (SAR) is essential to be controlled and can be evaluated by measuring either indirectly for instance the rise in temperature or directly the radiofrequency induced electrical E-field. In the current study, we proposed an optical probe based on the Pockels effect for subcentimeter resolution measurements of the E-field without altering the surrounding media. Measurements were performed at 4.7 T and 3.0 T. Results show that the probe has an excellent linear response and allow a real time estimate of the three components of the E-field produced during MRI examination.

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