In dual-echo subtraction ZTE (DE-ZTE) MRI, it is crucial to correct for gradient delays in the second echo for high image quality. Linear phase fitting on the relative phase difference between projection pairs in image domain can be performed to estimate TE shifts, but it is not highly robust. Field camera can be used to externally provide TE shifts arising from gradient delays, but the probes tend to dephase at high resolution DE-ZTE scans. We demonstrate that gradient delays can be characterized as a linear function of gradient strength. Furthermore, we show that this can be exploited to reconstruct high resolution DE-ZTE data at 7T for high image quality.
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