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Abstract #0647

MRI Safety Assessment of Orthopedic Implants on the Bone Surface via the Induced Tangential E-Fields

Manuel Murbach1, Earl Zastrow1, Esra Neufeld1, Theodoros Samaras2, Wolfgang Kainz3, and Niels Kuster1,4

1ITIS Foundation, Zurich, Switzerland, 2Department of Physics, Aristotle University of Thessaloniki, Thessaloniki, Greece, 3Center for Devices and Radiological Health (CDRH), US Food and Drug Administration (FDA), Silver Spring, MD, United States, 4Swiss Federal Institute of Technology (ETH), Zurich, Switzerland

Orthopedic implant manufacturers produce a large portfolio of on-bone devices. Current implant RF safety standards, e.g., ASTM F2182-11a and TS/ISO 10974, do not take advantage of very well-defined data on relevant RF exposures of these devices, i.e., E-fields tangential to the bone-surface. In our approach presented here, we explore the use of the bone-surface-averaged tangential E-field as a close approximation of the incident field impacting an on-bone orthopedic device. The relevant surface-averaged tangential E-fields are less than half of the corresponding peak volume-averaged E-fields, which allows for realistic but not overly conservative assessment of RF implant safety in MRI.

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