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Abstract #4213

Accurate Slice-Selective MRI near Metallic Implants with FOCUSED-xSPEN

Gil Farkash1, Gilad Liberman2, and Lucio Frydman2

1Chemical & Biological Physics, Weizmann Institute, Rehovot, Israel, 2Chemical & Biological Physics, Weizmann Institue, Rehovot, Israel

Metals frequently cause dramatic spatial inhomogeneities in the static field B0. This causes severe localization errors, including slice z-displacements and slice-thickness variations. Clinically used techniques often avoid such errors by adding a phase encoding loop in z, prolonging examination times. This study examines a novel Fully refOCUSED cross-term SPatio-temporal ENcoding (FOCUSED-xSPEN) approach, as a slice selection technique for 2D MRI in the presence of metal implants. The method relies on xSPEN’s proven immunity to in-plane distortions caused by B0 heterogeneities, to design a new excitation scheme that delivers faithful 2D slices near implants with reduced scan times.

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