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Abstract #0793

Explaining current patterns on linear metallic implants during MRI exams using the transfer matrix.

Janot P. Tokaya1, Peter R.S. Stijnman1,2, Peter R. Luijten1, Cornelis A.T. Berg1, and Alexander J.E. Raaijmakers1,2

1Center for Image Sciences, UMC Utrecht, Utrecht, Netherlands, 2Department of Biomedical Engineering, Eindhoven University of Technology, Eindhoven, Netherlands

Currents induced on relatively(<20cm) short linear metallic implants typically occur in certain patterns. Knowledge of these patterns can help current monitoring and identification of hazardous exposure conditions. The transfer matrix (TM) of an implant predicts what patterns will appear. The eigenvalues of the TM indicate which modes are induced naturally. The projection of the eigenvectors onto realistic incident electric fields obtained from electromagnetic simulations explain which modes are likely and effectively excited. Over 80% of electric field distributions excite the first eigenmode of the investigated structures more efficiently. Moreover, all severe currents follow the pattern of this first eigenmode.

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