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Abstract #1440

A MRI Gradient Induced Electric Field Exposure System for Active Implanted Medical Devices

Xiyao Xin1, Xi Lin Chen1, Xin Huang1, and Shiloh Sison1

1Abbott Laboratories, Sylmar, CA, United States

MRI gradient field can produce electric field (E-field) in a patient during MR scan. For patient with active implanted medical device (AIMD), damage and malfunction are the possible outcomes due to such exposure. The ISO/TS 10974 radiated immunity test method in Clause 16 focuses on producing radiated gradient field (dB/dt) exposure. This abstract proposes a test method which directly exposes AIMD to gradient frequency E-field, offering a controlled gradient frequency E-field exposure environment for AIMD MR conditional testing.

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