MRI gradient field can produce electric field (E-field) in a patient during MR scan. For patient with active implanted medical device (AIMD), damage and malfunction are the possible outcomes due to such exposure. The ISO/TS 10974 radiated immunity test method in Clause 16 focuses on producing radiated gradient field (dB/dt) exposure. This abstract proposes a test method which directly exposes AIMD to gradient frequency E-field, offering a controlled gradient frequency E-field exposure environment for AIMD MR conditional testing.
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