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Abstract #4160

B1+ Peak Based on Transmit Technologies and the Impact of Associated E Fields on AIMD MR RF Safety

Xin Huang1, Xi Lin Chen2, and Shiloh Sison1

1Abbott, Sunnyvale, CA, United States, 2Abbott, Sylmar, CA, United States

Circular polarization (CP), Linear Polarization (LP) and Multi-Channel-N (MC-N) are RF transmit technologies at 3T. The B1+ peak limit is dependent on the RF coil amplifier topology and the transmit scheme. This may lead to significant changes in the induced E field in a patient and affect the MR safety assessment for active implantable medical devices (AIMDs). This abstract shows that even though B1+ peak levels of LP is lower than that of CP or MC-N, the E-field along an implant during LP can exceed CP or MC-N. Therefore, since LP can be achieved within CP or MC-N, it should be considered for AIMD MR safety assessment.

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