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Abstract #0669

Spectrally-encoded multi-spectral imaging (SEMSI) for off-resonance correction near metallic implants. 

Daehyun Yoon1, Philip Lee2, Krishna Nayak3, and Brian Hargreaves1
1Radiology, Stanford University, Stanford, CA, United States, 2Electrical Engineering, Stanford University, Stanford, United Kingdom, 3Electrical and Computer Engineering, University of Southern California, Los Angeles, CA, United States

Multi-spectral imaging (MSI) including view-angle-tilting (VAT) is the dominant technique to correct for severe off-resonance artifacts near metallic implants. While VAT mitigates the signal pile-up and translation artifact in the area of severe off-resonance, it also causes global blurring and SNR loss in the on-resonance area away from metal. In this work, we introduce a novel spectrally encoded MSI approach, denoted SEMSI, that resolves pile-up and translation artifacts without VAT or z-phase encoding. Phantom imaging results show the promise of SEMSI to provide high-quality, artifact-free images in the presence of metallic implants without global blurring.

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