Multi-spectral imaging (MSI) including view-angle-tilting (VAT) is the dominant technique to correct for severe off-resonance artifacts near metallic implants. While VAT mitigates the signal pile-up and translation artifact in the area of severe off-resonance, it also causes global blurring and SNR loss in the on-resonance area away from metal. In this work, we introduce a novel spectrally encoded MSI approach, denoted SEMSI, that resolves pile-up and translation artifacts without VAT or z-phase encoding. Phantom imaging results show the promise of SEMSI to provide high-quality, artifact-free images in the presence of metallic implants without global blurring.
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