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Abstract #3781

Fast virtual B1-mapping for the in silico characterization of EPT

Alessandro Arduino1 and Luca Zilberti1
1Istituto Nazionale di Ricerca Metrologica (INRIM), Torino, Italy

A fast modelling of B1-mapping techniques is proposed for the in silico characterization of electric properties tomography method. The performances of three B1-mapping techniques are analyzed on a realistic model problem, obtaining information on the systematic errors and on the random errors through the application of a Monte Carlo method. An Helmholtz-based electric properties tomography technique is tested on input provided by the B1-mapping techniques.

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