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Abstract #3784

Electrical Properties Reconstruction from Free Induction Decay Measurements

Patrick Fuchs1 and Rob Remis1
1Microelectronics, Delft University of Technology, Delft, Netherlands

By incorporating scattering of dielectric tissue into the measurement model of the MRI signal we show a direct relationship between conductivity and permittivity of the tissue and the measured signal. Simplifying this for a known geometry a reconstruction of the dielectric properties is demonstrated based on the most simple of MRI signals, the finite induction decay or FID. This relationship can of course be exploited for more complicated applications such as local SAR, antenna design and optimisation and SNR computations, especially for high field applications.

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