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Abstract #0700

Measuring RF field-induced temperature variations in brain MRI exams with motion compensated MRT and field monitoring.

Caroline Le Ster1, Franck Mauconduit1, Christian Mirkes2, Alexandre Vignaud1, and Nicoal Boulant1
1Université Paris-Saclay, CNRS, BAOBAB, Neurospin, CEA, Gif-sur-Yvette, France, 2Skope MRT, Zurich, Switzerland


Sub-degree brain temperature rise occurring through RF power deposition during the MR exam was measured with MR thermometry at 7T using a multi-slice EPI sequence and concurrent field monitoring. This sequence was first tested in vitro with field perturbations, an optical probe being used for ground truth measurements, and the accuracy of the method reached 0.02°C. In vivo, this methodology was complemented by a motion compensation step and precision reached 0.05°C. After 20-min of scanning at maximal SAR, temperature rise induced by RF power deposition throughout the inner brain reached 0-0.2°C, well below the values predicted by thermal models.

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