Sub-degree brain temperature rise occurring through RF power deposition during the MR exam was measured with MR thermometry at 7T using a multi-slice EPI sequence and concurrent field monitoring. This sequence was first tested in vitro with field perturbations, an optical probe being used for ground truth measurements, and the accuracy of the method reached 0.02°C. In vivo, this methodology was complemented by a motion compensation step and precision reached 0.05°C. After 20-min of scanning at maximal SAR, temperature rise induced by RF power deposition throughout the inner brain reached 0-0.2°C, well below the values predicted by thermal models.
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