A compact dual-band E-field generator for MRI implant safety testing has been developed to produce diverse, well-defined tangential incident E-fields along defined implant test routings for efficient validation of the transfer function of AIMD. The MITS medical implant test system consists of two pairs of electrodes whose relative amplitude and phase are controlled to create E-field conditions at the frequencies corresponding to 1.5 T and 3 T MRI. Simulations of different exposure settings were validated by measurements of the resulting field distributions with an E-field vector probe along the routing paths.
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