Abstract #4647

Accelerated MRI near metallic implants at 0.55T using hexagonal sampling

Bahadir Alp Barlas¹, Kubra Keskin¹, Brian A Hargreaves^2,3,4, and Krishna S Nayak^1,5

¹Electrical and Computer Engineering, University of Southern California, Los Angeles, CA, United States, ²Radiology, Stanford University, Stanford, CA, United States, ³Electrical Engineering, Stanford University, Stanford, CA, United States, ⁴Bioengineering, Stanford University, Stanford, CA, United States, ⁵Biomedical Engineering, University of Southern California, Los Angeles, CA, United States

Synopsis

Keywords: Data Acquisition, Low-Field MRIMetallic implants cause severe distortions in the magnetic field that are best mitigated using multi-spectral acquisitions that require longer scan time. At conventional field strengths, this is compensated by aggressive use of parallel imaging. However, at low-field strengths (<1.5T), available parallel imaging factors are reduced because body noise dominance prevents the use of dense arrays with smaller elements. Hexagonal sampling (in k_y,k_z space) was previously proposed as a way to achieve 2-fold reduction in imaging time without introducing additional artifacts. In this work, we demonstrate applicability of the hexagonal sampling for 0.55T multi-spectral imaging near metal.

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