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Abstract #0788

MRI-conditional deep brain stimulation (DBS) implants: a new engineered design for enhanced safety

Francesca Marturano1, Tayeb Anderson Zaidi2, Aditya Tummala3, Laleh Golestani Rad2, and Giorgio Bonmassar1
1Radiology, Massachusetts General Hospital and Harvard Medical School, Charlestown, MA, United States, 2Northwestern University, Chicago, IL, United States, 3Harvard University, Cambridge, MA, United States

Synopsis

Keywords: Safety, Parkinson's Disease, Deep Brain Stimulation

Motivation: Currently, patients with Deep Brain stimulation (DBS) implants cannot leverage the diagnostic potential of Magnetic Resonance Imaging (MRI) as traditional metal-based leads pose several safety concerns.

Goal(s): We propose a new technology for manufacturing DBS microwires that ensures their safe operation with MRI up to 3T.

Approach: Through the development of a metamaterial-based design, we have engineered microwires that effectively partially reflect RF-induced current, thereby reducing Specific Absorption Rate (SAR), tip heating, and associated artifacts.

Results: Our manufactured microwires demonstrated minimal tip heating in both 1.5T and 3T MRI scanners when compared to standard wires.

Impact: This innovative design facilitates safe MRI imaging for individuals with DBS implants, marking a pivotal advancement in the study of neural mechanisms involved in medically refractory pathological conditions, such as Parkinson’s disease.

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