Daniel Joseph Park1, Ahsan Javed1, Neal Kepler Bangerter1,2, Mohammad Mehdi Khalighi3, Glen R. Morrell2
1Electrical & Computer Engineering, Brigham Young University, Provo, UT, United States; 2Department of Radiology, University of Utah, Salt Lake City, UT, United States; 3Global Applied Science Laboratory, GE Healthcare, Menlo Park, CA, United States
A statistical analysis of the Bloch-Siegert (BS), phase-sensitive (PS), dual-angle (DA), and actual flip angle (AFI) B1 mapping techniques is presented. The analysis employed a Monte Carlo simulation of the statistical performance of each technique based on the Bloch equations. The phase-sensitive B1 method is shown to yield consistently lower mean-bias estimates of the flip angle with a smaller standard deviation than each of the other techniques, even in low-SNR situations.