Christopher Thomas Sica1, Christopher M. Collins1
A novel, simultaneous B1+ and T1 mapping method is presented here. The proposed method relies upon a series of spoiled GRE scans acquired with a fixed TR and increment of the flip angle between scans. A non-linear fit is applied to the signal expression M0(1-E1)sin[λθ] / (1 E1cos[λθ]) to obtain both B1+ and T1. The proposed method is compared to the Actual Flip Angle Imaging (AFI) B1+ mapping method. The B1+ mapping results show excellent agreement with AFI, with error between the two methods typically on the order of several percent.