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Abstract #4465

Electrical Impedance Tomography using Magnetic Resonance as the Voltage Source

Michiro Negishi1, Tangji Tong1, Peter Brown1, Terrence Nixon1, R. Todd Constable1,2

1Diagnostic Radiology, Yale University, New Haven, CT, United States; 2Neurosurgery, Yale University, New Haven, CT, United States

We present a novel impedance imaging method called Magnetic Resonance Driven Electrical Impedance Tomography (MRDEIT), where magnetic resonance is used to apply voltages and the signals from surface electrodes or surface RF detectors are analyzed to obtain the complex permittivity distribution in the target volume. In the current study, we test whether the RF voltages measured by surface electrodes changes when the conductance of the phantom is altered as the theory predicts. The experiment results showed that a higher conductivity results in a higher average electrode voltage and that the spatial voltage profile from the Finite Element Method based simulations.