Abstract #4488

Spoiling Properties of the VAFI Method for Fast Simultaneous T1 & B1 Mapping from Actual Flip-Angle Imaging (AFI) & Variable Flip-Angle (VFA) Data.

Samuel Anthony Hurley¹, Vasily L. Yarnykh², Alexey A. Samsonov³

¹Medical Physics, University of Wisconsin, Madison, WI, United States; ²Radiology, University of Washington, Seattle, WA, United States; ³Radiology, University of Wisconsin, Madison, WI, United States

VAFI is a method for fast simultaneous T1 and B1 mapping from actual flip-angle imaging (AFI) and variable flip-angle (VFA) data. It has been shown that a combination of RF and gradient spoiling are essential for accurate T1 quantification, and these issues are investigated for the new VAFI sequence.