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Abstract #0962

Influence of T1 contrast and resolution on myelinated cortical thickness at 7 Tesla

Pierre-Louis Bazin 1 , Christine Lucas Tardif 1 , Arno Villringer 1 , and Nicholas Bock 2

1 Max Planck Institute for Human Cognitive and Brain Sciences, Leipzig, Germany, 2 McMaster University, Ontario, Canada

This work studies a newly proposed morphometric measurement in the cerebral cortex, the myelinated thickness and myelinated thickness ratio, in the context of high resolution 7 Tesla imaging. A new algorithm for myelinated thickness estimation is proposed, and the measures extracted from T1-weighted and quantitative T1 contrasts are compared at multiple resolutions.

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