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Abstract #3296

On the Signal-to-Noise Ratio of MR-Based Electrical Properties Tomography

Seung-Kyun Lee 1 , Selaka Bandara Bulumulla 1 , and Ileana Hancu 1

1 GE Global Research, Niskayuna, NY, United States

We present calculation of the random noise-limited signal-to-noise ratio (SNR) in MR-based electrical properties tomography (MREPT). We find that the SNR in the relative permittivity and electrical conductivity is determined primarily by the SNR of the magnitude and the phase of the B1+ map, respectively. In addition, the SNR is proportional to the square of the linear dimension of the region-of-interest, to the square root of the number of voxels, and to the inverse square of the RF length scales in the medium. Our results can inform design of MREPT experiments with a desired SNR.

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