Integral-based Magnetic Resonance Electrical Properties Tomography (MR-EPT), has seen rapid development in recent years. Compared with differential-based MR-EPT methods, integral-based methods are less sensitive to measurement noise and free from boundary conditions. The integral-based MR-EPT methods rely on the global convolution between the Green function and the contrast source, and also require the knowledge of incident fields. This study investigates a novel method to approximate the contrast source, and then utilizes this approximation to calculate the incident electric fields.
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