Generally, automated scan plane planning methods require the recognition of different landmarks depending on the examination parts. Therefore, algorithms must be tailored to each examination part. In this study, we have proposed a modular algorithm developing method for automatic scan plane planning. In this method, an algorithm is composed of several common processes, and by simply changing the combination of those processes, it can be tailored to different examination parts.
This abstract and the presentation materials are available to members only; a login is required.