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Abstract #0983

Test-retest reliability of whole-brain and bundle-level microstructural properties

Timo Roine1,2 and Sila Genc3
1Department of Neuroscience and Biomedical Engineering, Aalto University, Espoo, Finland, 2Turku Brain and Mind Center, University of Turku, Turku, Finland, 3Cardiff University Brain Research Imaging Centre (CUBRIC), School of Psychology, Cardiff University, Cardiff, United Kingdom


We investigated the test-retest reliability of bundle- and voxel-/fixel-level microstructural metrics with fixel-based analysis, neurite orientation dispersion and density imaging, and diffusion tensor imaging. For the bundle-level analyses, TractSeg was used to automatically segment 72 fiber bundles of the brain. Our results indicate that most of the metrics, especially those measured with fixel-based analysis, are highly robust and show excellent test-retest reliability both in local and bundle-level analyses. In general, the reproducibility was higher in the white matter in contrast to gray matter and for acquisitions with multi-shell compared to single-shell data.

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